A Correlated Double Sampling Technique for Charge-Sensitive Amplifiers based on TFTs

In this work is presented a low-noise Charge Sensitive Amplifier (CSA) suitable for the readout of high-impedance pyroelectric sensors. The circuit exploits a novel Correlated Double Sampling (CDS) technique which allows both continuous-time integration and cancellation of the Thin-Film Transistor (...

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Bibliographic Details
Published in2022 IEEE International Symposium on Circuits and Systems (ISCAS) pp. 86 - 90
Main Authors Fattori, Marco, Genco, Enrico
Format Conference Proceeding
LanguageEnglish
Published IEEE 28.05.2022
Subjects
1/f noise
Capacitors
Charge Sensitive Amplifier (CSA)
Correlated-Double Sampling (CDS)
Flexible Electronics
Organic thin film transistors
pyroelectric sensor
Sensors
Simulation
Switches
Thin film transistors
Thin-Film Transistors (TFTs)
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Summary:In this work is presented a low-noise Charge Sensitive Amplifier (CSA) suitable for the readout of high-impedance pyroelectric sensors. The circuit exploits a novel Correlated Double Sampling (CDS) technique which allows both continuous-time integration and cancellation of the Thin-Film Transistor (TFT) 1/f noise. The CSA has been implemented in a printed unipolar Organic TFT technology and simulation results demonstrate a Signal-to-Noise Ratio (SNR) improvement of approximately 10 dB when the proposed CDS technique is applied at the frequency of 500 Hz. This result is expected e.g., to extend the proximity detection range and improve the safety in human-machine applications using large-area infrared-sensing surfaces. Moreover, the proposed technique can be used in generic Analog Frontend Electronics embedding switched capacitor amplifiers, to suppress correlated noise sources.
ISSN:2158-1525
DOI:10.1109/ISCAS48785.2022.9937715