Innovative Practices Track: Test of 3D ICs & Chiplets
Author: Sandeep Kumar Goel
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Published in | 2022 IEEE 40th VLSI Test Symposium (VTS) p. 1 |
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Main Authors | , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
25.04.2022
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Subjects | |
Online Access | Get full text |
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Summary: | Author: Sandeep Kumar Goel |
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ISSN: | 2375-1053 |
DOI: | 10.1109/VTS52500.2021.9794242 |