Reference Measurements of Error Vector Magnitude

We demonstrate the applicability of the IEEE P1765 Reference Waveforms in ascertaining EVM and associated uncertainties by performing traceable measurements on a calibrated equivalent-time sampling oscilloscope at 44 GHz. With this knowledge, a user can employ the IEEE P1765 measurement-comparison a...

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Bibliographic Details
Published in2022 IEEE/MTT-S International Microwave Symposium - IMS 2022 pp. 1026 - 1029
Main Authors Manurkar, Paritosh, Silva, Christopher P., Kast, Joshua, Horansky, Robert D., Williams, Dylan F., Remley, Kate A.
Format Conference Proceeding
LanguageEnglish
Published IEEE 19.06.2022
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Summary:We demonstrate the applicability of the IEEE P1765 Reference Waveforms in ascertaining EVM and associated uncertainties by performing traceable measurements on a calibrated equivalent-time sampling oscilloscope at 44 GHz. With this knowledge, a user can employ the IEEE P1765 measurement-comparison approach using these reference waveforms in their laboratory to estimate the impact of their receiver on EVM and its associated uncertainties.
ISSN:2576-7216
DOI:10.1109/IMS37962.2022.9865278