Study on the Factors of Start-up White Line Caused by Coupled Electric Field in TFT LCD

In this paper, we report on the factors of Start-up White Line defect caused by coupled electric field. The defect appeared near the Gate signal line of the display area at zero gray step of the start-up sequence. The failure mechanism was found out to be the coupled electric field caused by the vol...

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Bibliographic Details
Published in2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) pp. 1 - 4
Main Authors Li, Xin, Song, Yong, Yu, Hongjun, Che, Chuncheng, Xue, Hailin
Format Conference Proceeding
LanguageEnglish
Published IEEE 15.09.2021
Subjects
Black matrix
Coupled electric field
Couplings
Failure analysis
Integrated circuits
Liquid crystal displays
Logic gates
Resistance
Voltage
Voltage difference
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Summary:In this paper, we report on the factors of Start-up White Line defect caused by coupled electric field. The defect appeared near the Gate signal line of the display area at zero gray step of the start-up sequence. The failure mechanism was found out to be the coupled electric field caused by the voltage difference between the Common and Gate-Low signals. It affected the charge density in the surrounding Black Matrix and created a new electric field which disturbed the deflection of the liquid crystal. Further experiments and analysis showed that the failure was related to the voltage difference between the common and Gate-Low signals, the resistance of Black Matrix, the pattern of Black Matrix.
ISSN:1946-1550
DOI:10.1109/IPFA53173.2021.9617411