Enabling Autonomous Computing: Technology Solutions That Anticipate and Avert Failure

Current and future compute require a solution to guarantee zero failures of the architecture throughout a systems useful life. Traditional technology solutions that guarantee requirements have become difficult as field use conditions have moved from an electrical "nominal" to "maximum...

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Bibliographic Details
Published inProceedings. Annual Reliability and Maintainability Symposium pp. 1 - 8
Main Author Tonti, William R.
Format Conference Proceeding
LanguageEnglish
Published IEEE 24.01.2022
Subjects
Anode
Built in Self Repair
Built in Self Test
Cathode
Channel Length
Channel Width
Computer architecture
Computers
e-odometer
Electromigration
Electronic Fuse
Fuses
Maintenance engineering
Oxide Thickness
Random access memory
Smart Manufacturing
Threshold Voltage
Voltage
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Summary:Current and future compute require a solution to guarantee zero failures of the architecture throughout a systems useful life. Traditional technology solutions that guarantee requirements have become difficult as field use conditions have moved from an electrical "nominal" to "maximum". This results in wear-out encroaching upon the product useful-life. This is undesirable, many manufacturers have looked for solutions to avoid premature failure [1]. The subject of this paper are the chip techniques that anticipate or react to failure, followed by enabling a repair solution. This paper describes how a known reliability mechanism, electromigration, is studied, qualified, and then implemented as a technology solution to substantially improve a systems useful life. The solution proposed is a new two terminal electrical fuse, known as the eFuse.
ISSN:2577-0993
DOI:10.1109/RAMS51457.2022.9894000