Spiral-scan Atomic Force Microscopy: A constant linear velocity approach

This paper describes an alternative method to the widely-used raster-scan technique for Atomic Force Microscopy (AFM). In this method, the sample is scanned in a spiral pattern instead of the well established raster trajectory. A spiral pattern is produced by applying cosine and sine signals with sl...

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Bibliographic Details
Published in10th IEEE International Conference on Nanotechnology pp. 115 - 120
Main Authors Mahmood, Iskandar A, Moheimani, S O Reza
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.08.2010
Subjects
Bandwidth
Electron tubes
Equations
Mathematical model
Spirals
Trajectory
Transfer functions
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Summary:This paper describes an alternative method to the widely-used raster-scan technique for Atomic Force Microscopy (AFM). In this method, the sample is scanned in a spiral pattern instead of the well established raster trajectory. A spiral pattern is produced by applying cosine and sine signals with slowly varying amplitudes to the x-axis and y-axis of an AFM scanner respectively. In order to ensure that the spiral trajectory travels at a constant linear velocity (CLV), frequency and amplitude of the input signals are varied simultaneously in a way that the linear velocity of the scanner is kept constant. Experimental results obtained by implementing the CLV spiral scan on a commercial AFM indicate that, compared with the raster-scan method, high-quality AFM images of equal area and pitch can be generated two times faster and using half of the total traveled distance.
ISBN:1424470331
9781424470334
ISSN:1944-9399
1944-9380
DOI:10.1109/NANO.2010.5698063