Extreme Metaphotonics with Ultra High-Index Topological Insulators

We experimentally measure the complex dielectric constant of Bi 2 Se 3 and Bi 2 Te 3 topological insulators, revealing record high refractive index values peaking at n≈11. We further demonstrate deep-subwavelength metasurfaces with unit cell sizes smaller than λ/10, that simultaneously support large...

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Bibliographic Details
Published in2023 Conference on Lasers and Electro-Optics (CLEO) pp. 1 - 2
Main Authors Nandi, Sukanta, Singh, Danveer, Cohen, Shany Zrihan, Lewi, Tomer
Format Conference Proceeding
LanguageEnglish
Published OSA 01.05.2023
Subjects
Dielectric constant
Dielectric measurement
Lasers and electrooptics
Magnetic field measurement
Metasurfaces
Refractive index
Topological insulators
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Summary:We experimentally measure the complex dielectric constant of Bi 2 Se 3 and Bi 2 Te 3 topological insulators, revealing record high refractive index values peaking at n≈11. We further demonstrate deep-subwavelength metasurfaces with unit cell sizes smaller than λ/10, that simultaneously support large magnetic and electric field enhancements.
DOI:10.1364/CLEO_FS.2023.FF1D.7