About the assessment of electronic device immunity to high power electromagnetic pulses

We have considered some shortcomings of the standard way of the assessment of electronic device immunity to high power EMPs. And we offer a way, which is based on the use of key parameters of pulse electric disturbances induced in circuits of equipment. This way allows assessing the dependence of re...

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Bibliographic Details
Published in2015 7th Asia-Pacific Conference on Environmental Electromagnetics (CEEM) pp. 428 - 431
Main Authors Parfenov, Yury V., Titov, Boris A., Zdoukhov, Leonid N., Radasky, William A.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.11.2015
Subjects
Electromagnetic scattering
Electromagnetics
HEMP simulators
high altitude electromagnetic pulse (HEMP)
key parameters
Lead
pulse electric disturbance
Testing
ultrashort electromagnetic pulse (USEMP)
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Summary:We have considered some shortcomings of the standard way of the assessment of electronic device immunity to high power EMPs. And we offer a way, which is based on the use of key parameters of pulse electric disturbances induced in circuits of equipment. This way allows assessing the dependence of results of testing electronic devices from the degree of conformity of EMPs in test volumes of simulators to typical EMPs, but also from degree of conformity of EMPs formed by simulators to real EMPs.
ISBN:9781467394444
1467394440
DOI:10.1109/CEEM.2015.7368616