Measurements of the 12 nA low frequency oscillator

• Published in: 2015 Argentine School of Micro-Nanoelectronics, Technology and Applications (EAMTA) pp. 22 - 27
• Main Authors: Cayuela, Pablo O., Arnaud, Alfredo
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.07.2015
• Subjects: Analog Circuit Design; Current measurement; Frequency measurement; Integrated circuit modeling; MOS transistor; Oscillator; Oscillators; Temperature measurement; Transistors; Ultra Low Power Circuits; Voltage measurement; Weak Inversion

In this work, measurements of the two versions of the 12 nA Low Frequency Oscillator is presented. The circuit designed in a standard 0.6 μm MOS technology with most of the transistors operating in weak inversion, includes self-bias current and voltage references, and can be powered with a wide rang...