CIP metrology improving the bump yield in photo-lithography process
With the seven quality control methods under the CIP control, the entire package yield in micro-bump products is promoted from 99.31% to 99.58% during four-month record and tracking. Through these effective and analytical efforts, the rework ratio in the abnormal PR coating contribution was decrease...
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Published in | 2015 10th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) pp. 386 - 389 |
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Main Authors | , , , , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
01.10.2015
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Subjects | |
Online Access | Get full text |
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Summary: | With the seven quality control methods under the CIP control, the entire package yield in micro-bump products is promoted from 99.31% to 99.58% during four-month record and tracking. Through these effective and analytical efforts, the rework ratio in the abnormal PR coating contribution was decreased from 0.29% to 0.19%. The result for the auto misalignment was reduced from 0.23% to 0.13% as well for the repeatable defect from 0.17% to 0.1%. The whole package yield during these three issues was promoted around 0.3%. |
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ISBN: | 9781467396905 1467396907 |
DOI: | 10.1109/IMPACT.2015.7365235 |