Localized two-step galvanic replacement of a tip apex modification for field sensitive scanning probe microscopy

In this paper, a platinum-silver composite nano-dot (Pt@Ag ND) decorated tip apex was successfully fabricated by utilizing a localized two-step galvanic replacement. In the first replacement, Ag-ND tip was prepared by the replacement between silicon and silver ion through fluoride assisted galvanic...

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Bibliographic Details
Published inThe 9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) pp. 176 - 179
Main Authors Chun-Ting Lin, Mao-Nan Chang, Yu-Wei Chen, Shu-Hung Tung, Chu, Nancy, Chien-Nan Hsiao, Ming-Hua Shiao
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.04.2014
Subjects
Gold
Physics
Scanning electron microscopy
Scanning probe microscopy
Silicon
Silver
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Summary:In this paper, a platinum-silver composite nano-dot (Pt@Ag ND) decorated tip apex was successfully fabricated by utilizing a localized two-step galvanic replacement. In the first replacement, Ag-ND tip was prepared by the replacement between silicon and silver ion through fluoride assisted galvanic replacement reaction. In the second replacement, the Ag ND was further changed to Pt by the interaction between Ag and chloroplatinic acid. Our preliminary results demonstrated the possibility of preparing either a single metal-nanodot (metal-ND) or core-shell structure modified tip apexes for field sensitive scanning probe microscopy (FS-SPM) applications.
DOI:10.1109/NEMS.2014.6908785