Memristor Testing Needs Compared to Existing CMOS Testing Methods

This paper provides a comparison of established CMOS circuit testing concepts to the existing memristor testing efforts to identify memristor circuit testing needs. A very brief review of many CMOS testing concepts is provided to give a basis for comparison with memristor testing. A short simple ove...

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Bibliographic Details
Published in2023 International Symposium on Signals, Circuits and Systems (ISSCS) pp. 1 - 6
Main Authors Joshi, Rasika, Acken, John M
Format Conference Proceeding
LanguageEnglish
Published IEEE 13.07.2023
Subjects
Circuits and systems
CMOS technology
CMOS testing
Fault detection
Fault diagnosis
fault models
memristor testing
Memristors
Semiconductor device modeling
sneak paths
Surveys
test generation
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Summary:This paper provides a comparison of established CMOS circuit testing concepts to the existing memristor testing efforts to identify memristor circuit testing needs. A very brief review of many CMOS testing concepts is provided to give a basis for comparison with memristor testing. A short simple overview of memristor theory precedes a survey of existing memristor testing efforts. Specifically, an analysis of testing sneak paths for fault detection and fault diagnosis is presented. A list of concepts that are equally applicable to both CMOS and memristor technologies have been described and those unique to memristor circuits have been identified.
DOI:10.1109/ISSCS58449.2023.10190937