High-power Density W-band MMIC Amplifiers using Graded-channel GaN HEMTs

We report the W-band amplifier performance of graded-channel GaN HEMTs with f T and f MAX of 170 GHz and 347 GHz, respectively. Graded-channel GaN HEMTs with a gate periphery of 0.15 mm show a peak power-added-efficiency of 50% at 94 GHz at 2.2 W/mm associated power density after deembedding of the...

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Published in2023 IEEE/MTT-S International Microwave Symposium - IMS 2023 pp. 97 - 100
Main Authors Moon, Jeong-Sun, Grabar, Bob, Wong, Joel, Tai, Joe, Ramos, Ignacio, Arkun, Erdem, Dao, Chuong, Fanning, Dave, Miller, Nicholas C., Elliott, Michael, Gilbert, Ryan, Venkatesan, Nivedhita, Fay, Patrick
Format Conference Proceeding
LanguageEnglish
Published IEEE 11.06.2023
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Abstract We report the W-band amplifier performance of graded-channel GaN HEMTs with f T and f MAX of 170 GHz and 347 GHz, respectively. Graded-channel GaN HEMTs with a gate periphery of 0.15 mm show a peak power-added-efficiency of 50% at 94 GHz at 2.2 W/mm associated power density after deembedding of the matching network loss of 0.3 dB. Pre-matched power cells with 0.6 mm total gate periphery yielded 2.1 W output power and 3.5 W/mm power density at 94 GHz. Finally, we report three-stage W-band amplifiers with a peak gain of 22.5 dB at 92.5 GHz, yielding 7.5 dB gain per stage.
AbstractList We report the W-band amplifier performance of graded-channel GaN HEMTs with f T and f MAX of 170 GHz and 347 GHz, respectively. Graded-channel GaN HEMTs with a gate periphery of 0.15 mm show a peak power-added-efficiency of 50% at 94 GHz at 2.2 W/mm associated power density after deembedding of the matching network loss of 0.3 dB. Pre-matched power cells with 0.6 mm total gate periphery yielded 2.1 W output power and 3.5 W/mm power density at 94 GHz. Finally, we report three-stage W-band amplifiers with a peak gain of 22.5 dB at 92.5 GHz, yielding 7.5 dB gain per stage.
Author Dao, Chuong
Arkun, Erdem
Fanning, Dave
Moon, Jeong-Sun
Grabar, Bob
Ramos, Ignacio
Elliott, Michael
Wong, Joel
Venkatesan, Nivedhita
Gilbert, Ryan
Tai, Joe
Fay, Patrick
Miller, Nicholas C.
Author_xml – sequence: 1
  givenname: Jeong-Sun
  surname: Moon
  fullname: Moon, Jeong-Sun
  email: jmoon@hrl.com
  organization: HRL Laboratories,USA
– sequence: 2
  givenname: Bob
  surname: Grabar
  fullname: Grabar, Bob
  organization: HRL Laboratories,USA
– sequence: 3
  givenname: Joel
  surname: Wong
  fullname: Wong, Joel
  organization: HRL Laboratories,USA
– sequence: 4
  givenname: Joe
  surname: Tai
  fullname: Tai, Joe
  organization: HRL Laboratories,USA
– sequence: 5
  givenname: Ignacio
  surname: Ramos
  fullname: Ramos, Ignacio
  organization: HRL Laboratories,USA
– sequence: 6
  givenname: Erdem
  surname: Arkun
  fullname: Arkun, Erdem
  organization: HRL Laboratories,USA
– sequence: 7
  givenname: Chuong
  surname: Dao
  fullname: Dao, Chuong
  organization: HRL Laboratories,USA
– sequence: 8
  givenname: Dave
  surname: Fanning
  fullname: Fanning, Dave
  organization: HRL Laboratories,USA
– sequence: 9
  givenname: Nicholas C.
  surname: Miller
  fullname: Miller, Nicholas C.
  organization: The Air Force Research Laboratory Sensors Directorate, WPAFB,USA
– sequence: 10
  givenname: Michael
  surname: Elliott
  fullname: Elliott, Michael
  organization: The Air Force Research Laboratory Sensors Directorate, WPAFB,USA
– sequence: 11
  givenname: Ryan
  surname: Gilbert
  fullname: Gilbert, Ryan
  organization: The Air Force Research Laboratory Sensors Directorate, WPAFB,USA
– sequence: 12
  givenname: Nivedhita
  surname: Venkatesan
  fullname: Venkatesan, Nivedhita
  organization: University of Notre Dame,Department of Electrical Engineering,USA
– sequence: 13
  givenname: Patrick
  surname: Fay
  fullname: Fay, Patrick
  organization: University of Notre Dame,Department of Electrical Engineering,USA
BookMark eNo1z8tOwkAUgOHRaCIgb2DMvMDUuXRuS4LQNqG6EOOSnLanMAYG0sEY3t6Fuvp3X_KPyU08RiTkUfBMCO6fqvpNWW_yTHKpMsGFc9z5KzL11julucqtye01GUltDbNSmDsyTumTc66dMCNSlmG7Y6fjNw70GWMK5wv9YA3EjtZ1Naezw2kf-oBDol8pxC0tBuiwY-0OYsQ9LeCFlot6ne7JbQ_7hNO_Tsj7crGel2z1WlTz2YoFIfyZKW2EddCaxqGTUncW0Akwfd5yr5vG2K4TLZfSogRtWi_BQgNGesC211pNyMOvGxBxcxrCAYbL5v9c_QDbeE3r
ContentType Conference Proceeding
DBID 6IE
6IH
CBEJK
RIE
RIO
DOI 10.1109/IMS37964.2023.10188089
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan (POP) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Xplore
IEEE Proceedings Order Plans (POP) 1998-present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISBN 9798350347647
EISSN 2576-7216
EndPage 100
ExternalDocumentID 10188089
Genre orig-research
GroupedDBID -~X
6IE
6IF
6IH
6IK
6IL
6IM
6IN
AAJGR
ABPPZ
ACGFS
ADZIZ
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
CHZPO
IPLJI
JC5
M43
OCL
RIE
RIL
RIO
ID FETCH-LOGICAL-i119t-356178ac6b8e8225d7ae81a6f4c095bb67dd1c0227e2a56c92a7aba629aecf553
IEDL.DBID RIE
IngestDate Wed Jun 26 19:25:18 EDT 2024
IsPeerReviewed false
IsScholarly true
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i119t-356178ac6b8e8225d7ae81a6f4c095bb67dd1c0227e2a56c92a7aba629aecf553
PageCount 4
ParticipantIDs ieee_primary_10188089
PublicationCentury 2000
PublicationDate 2023-June-11
PublicationDateYYYYMMDD 2023-06-11
PublicationDate_xml – month: 06
  year: 2023
  text: 2023-June-11
  day: 11
PublicationDecade 2020
PublicationTitle 2023 IEEE/MTT-S International Microwave Symposium - IMS 2023
PublicationTitleAbbrev IMS
PublicationYear 2023
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0005816
Score 2.2721698
Snippet We report the W-band amplifier performance of graded-channel GaN HEMTs with f T and f MAX of 170 GHz and 347 GHz, respectively. Graded-channel GaN HEMTs with a...
SourceID ieee
SourceType Publisher
StartPage 97
SubjectTerms communications
Density measurement
GaN
HEMTs
Logic gates
Microwave amplifiers
Microwave communication
mm-wave
MMIC
Power amplifiers
Power system measurements
W-band
Title High-power Density W-band MMIC Amplifiers using Graded-channel GaN HEMTs
URI https://ieeexplore.ieee.org/document/10188089
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1JSwMxFA7ak17cKu7k4DXTZtbkKNp2FKYItthbeZO8EVGmpU4P-uvNm7ZWBcFbCGQhL_CyfAtjlwXhdEJA-mF0FxQwsdBQKIFGRWC121KG3juyfpwOw7tRNFqS1WsuDCLW4DP0qFj_5duJmdNTWYvUpVRb6U22qdr-gqy1xnMoGS8pwLKtW7fZQ0A0S4_8wb1Vyx8eKnUK6e6w_mrwBXLkxZtXuWc-fuky_nt2u6y5Zuvx-688tMc2sNxn29-EBg9YSnAOMSVHNH5DkPXqnT-KHErLMxcHfkW48oJcsTkB4Z94bwYWrSBacImvvAd9nnaywVuTDbudwXUqlh4K4llKXYkgIg6gC0Gu0J0FIpsAKglxERp3uMrzOLFWGtIRRB-i2GgfEsgh9jWgKaIoOGSNclLiEePGJyGBwBhrMEQduk6CoCjQ3TANYCKPWZMWZTxdyGSMV-tx8kf9Kdui2BDuSsoz1qhmczx3Gb7KL-rIfgIEg6UI
link.rule.ids 310,311,786,790,795,796,802,27958,55109
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3LS8MwGA86D-rF18S3OXhNZ_pIm6Potk7XIrjhbiNNvooo3ZjdQf9683WbU0HwFhKahHyFL4_fg5CLHHE6vgJ8YbQHFKUFkyqPGOgoUEbaX0rjfUeSirjv3w6CwZysXnFhAKACn4GDxeot34z0FK_KGqguFV1GcpWs2UR_KWd0rSWiI-JiTgK2jY1O8uAh0dJBh3Bn8e0PF5UqibS2SLoYfoYdeXGmZeboj1_KjP-e3zapL_l69P4rE-2QFSh2yeY3qcE9EiOgg43RE43eIGi9fKePLFOFoYmNBL1CZHmOvtgUofBPtD1RBgxDYnABr7StUho3k95bnfRbzd51zOYuCuyZc1kyL0AWoA1CFoHdDQQmVBBxJXJf2-1VlonQGK5RSRBcFQgtXRWqTAlXKtB5EHj7pFaMCjggVLsoJeBpbTT4IH3bieflOdgzplYQ8kNSx0UZjmdCGcPFehz9UX9O1uNe0h12O-ndMdnAOCEKi_MTUisnUzi1-b7MzqoofwLr7Khe
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2023+IEEE%2FMTT-S+International+Microwave+Symposium+-+IMS+2023&rft.atitle=High-power+Density+W-band+MMIC+Amplifiers+using+Graded-channel+GaN+HEMTs&rft.au=Moon%2C+Jeong-Sun&rft.au=Grabar%2C+Bob&rft.au=Wong%2C+Joel&rft.au=Tai%2C+Joe&rft.date=2023-06-11&rft.pub=IEEE&rft.eissn=2576-7216&rft.spage=97&rft.epage=100&rft_id=info:doi/10.1109%2FIMS37964.2023.10188089&rft.externalDocID=10188089