A CMOS Time-of-Flight Image Sensor with High Dynamic Range Digital Pixel

To widen measuring range and suppress background light, a CMOS time-of-flight image sensor with high dynamic range digital pixel is proposed. The sensing charge is quantized by extended-counting analogue-to-digital converter (ADC) which consists of pixel coarse quantization and column fine quantizat...

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Bibliographic Details
Published in2021 IEEE 14th International Conference on ASIC (ASICON) pp. 1 - 4
Main Authors Yu, Shanzhe, Zhang, Yacong, Zhou, Fei, Lu, Wengao, Lei, Shuyu, Chen, Zhongjian
Format Conference Proceeding
LanguageEnglish
Published IEEE 26.10.2021
Subjects
CMOS image sensors
Conferences
Dynamic range
Prototypes
PSNR
Quantization (signal)
Simulation
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Summary:To widen measuring range and suppress background light, a CMOS time-of-flight image sensor with high dynamic range digital pixel is proposed. The sensing charge is quantized by extended-counting analogue-to-digital converter (ADC) which consists of pixel coarse quantization and column fine quantization. To maximize dynamic range in limited pixel area, the coarse quantization circuit is shared by 2×2 pixels, in which a novel up/down counter with a small number of transistors is proposed. Based on the pixel circuit, a 32×32 prototype TOF imager with 12μm-pitch digital pixel is designed in 0.11μm 1P4M CMOS image sensor technology. Simulation results show that a 104.6dB dynamic range of this ADC for wide measuring range is achieved at a frame rate of 50Hz.
ISSN:2162-755X
DOI:10.1109/ASICON52560.2021.9620349