Frequency-dependent oscillating wall stirrer for measurement of quality factor in a reverberation chamber
As a key parameter, the quality value (Q value) performs an important role in reverberation chamber validation progress. The Oscillating wall stirrer (OWS), as a quasi-wall, manifests well performance especially near the lowest usable frequency (LUF), which may change the Q value during the stirring...
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Published in | 2019 IEEE International Conference on Computation, Communication and Engineering (ICCCE) pp. 142 - 145 |
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Main Authors | , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
01.11.2019
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Subjects | |
Online Access | Get full text |
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Summary: | As a key parameter, the quality value (Q value) performs an important role in reverberation chamber validation progress. The Oscillating wall stirrer (OWS), as a quasi-wall, manifests well performance especially near the lowest usable frequency (LUF), which may change the Q value during the stirring progress. Unlike the traditional stirrer, the OWS oscillates rather than rotates on the stirring process, which brings the volume a variable to the estimation. In this paper, measurement for the Q value concentrates on frequency-domain and the frequency-stirred method has been carried out. Twelve typical stirring positions of Q values have been presented to investigate whether the OWS changes Q value. The measurement uncertainty of the results with and without the stirring progress has been compared to reveal the relationship between the Q factor and the movement of OWS. |
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DOI: | 10.1109/ICCCE48422.2019.9010772 |