Extraction of Characteristic Terms from Patent Documents for Technical Trend Analysis

In this paper, we propose a method that automatically extracts terms defined "characteristic terms" from several patent documents belonging to a certain technical field. The characteristic terms extracted by our method are useful for technology trend analysis. For example, in the case of p...

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Bibliographic Details
Published in2019 8th International Congress on Advanced Applied Informatics (IIAI-AAI) pp. 667 - 672
Main Authors Takano, Kaito, Tanaka, Miryu, Sakai, Hiroyuki, Kitajima, Ryozo, Ota, Takahisa, Tanabe, Chinatsu, Sakaji, Hiroki
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.07.2019
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Summary:In this paper, we propose a method that automatically extracts terms defined "characteristic terms" from several patent documents belonging to a certain technical field. The characteristic terms extracted by our method are useful for technology trend analysis. For example, in the case of patent documents relating to an organic electroluminescence (EL), the characteristic term is a word that expresses the characteristic of the technology shown in the patents, such as " Luminous efficiency (hakkoukouritu: luminous efficiency)" or " Luminance (koudo:brightness)". Finally, our method was evaluated and as a result of that, good results were obtained.
DOI:10.1109/IIAI-AAI.2019.00138