Electromagnetic Characterization of the Tommy Atkins Mango in the Maturation Period

• Published in: 2019 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference (IMOC) pp. 1 - 3
• Main Authors: Lima, Cristiano Miranda Correia, Carvalho, Joabson Nogueira de, Andrade, Everson Pereira de, Gomes, Jose Gilberto Sobreira
• Format: Conference Proceeding
• Language: English
• Published: IEEE 10.11.2019
• Subjects: Dielectric constant; Dielectric loss measurement; Dielectric losses; Dielectric measurement; Frequency measurement; loss factor; Loss measurement; mango; measurements; Permittivity
• DOI: 10.1109/IMOC43827.2019.9317621

This work presents the characterization of the dielectric properties (dielectric constant and loss factor) of the Tommy Atkins mango (Mangifera indica L), which is a fruit of great economic importance for Brazil. For the characterization, the coaxial probe method was used for frequencies between 1 and 5 GHz. The Vector Network Analyzer 16451B and the software Dielectric Probe 85070 manufactured by Agilent were used. Measurements were performed on the outer part of the fruit, on the shell and also on the inside, relating the results to the maturation index of the mango, identified by the yellowish tone in its shell, as well as the amount of soluble solids (amount of sugar). The results allowed to correlate the dielectric characteristics of the fruit with the physical-chemical transformations that occurred in the maturation process of the mango, as well as the sugar content. The lowest value was determined for the dielectric constant and for the tangent of losses on the day of the fruit's peak maturity. The results show that it is possible to identify the properties of the mango studied through non-invasive measures on the fruit peel.