Comparative analysis of the impact of multiple faults on the performance of fast repulsion mechanism

• Published in: 2022 IEEE 2nd International Conference on Data Science and Computer Application (ICDSCA) pp. 311 - 315
• Main Authors: Ning, Linru, Peng, Zhaowei, Xu, Dangguo, Song, Peng, Li, Yamei, Huang, Shiyang
• Format: Conference Proceeding
• Language: English
• Published: IEEE 28.10.2022
• Subjects: Analytical models; Capacitors; comparative analysis; failure; Fast repulsion mechanism; Force; Logic gates; performance impact; Simulation; Switches; Voltage
• DOI: 10.1109/ICDSCA56264.2022.9988028

The fast repulsion mechanism plays a crucial role in fast mechanical switching, and although the structure is simple, it is prone to certain failures. To address this issue, this paper first gives a brief overview of the working principle of the fast repulsive mechanism, builds a simulation model of the fast repulsive mechanism using Maxwell, studies three kinds of failures caused by the repulsive disc damage, jamming and unstable capacitor charging voltage, and simulates the above three types of failures and the normal operation state separately for comparative analysis. The results show that when the repulsive disc is damaged, the electromagnetic repulsion force and movement speed will decrease with the increase of the crack depth when the crack depth of the repulsive disc gradually increases; when the jamming force gradually increases, the displacement and movement speed will decrease with the increase of the jamming force; when the capacitor charging voltage gradually decreases, the coil current, electromagnetic repulsion force and displacement will decrease with the decrease of the capacitor, and even cannot the normal division of the gate.