Effects of the local field and inherent deformation in reflectance anisotropy spectra of AIIIBV semiconductor surfaces
Reflectance anisotropy (RA) spectra of naturally oxidized GaAs(001) and InAs(001) surfaces reveal features that differ qualitatively from those caused by reconstruction of clean surfaces or surface electric fields of the crystals. We show that the observed RA spectra of the semiconductor/oxide syste...
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Published in | Physica status solidi. B. Basic research Vol. 247; no. 8; pp. 1932 - 1936 |
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Main Authors | , , |
Format | Journal Article Conference Proceeding |
Language | English Russian |
Published |
Berlin
WILEY-VCH Verlag
01.08.2010
WILEY‐VCH Verlag Wiley-VCH |
Subjects | |
Online Access | Get full text |
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Summary: | Reflectance anisotropy (RA) spectra of naturally oxidized GaAs(001) and InAs(001) surfaces reveal features that differ qualitatively from those caused by reconstruction of clean surfaces or surface electric fields of the crystals. We show that the observed RA spectra of the semiconductor/oxide systems are simultaneously influenced by interface and near‐surface anisotropies whose physical origins are different. The interface anisotropy is associated with anisotropic polarizability of the valence bonds belonging to a monatomic layer of excess As atoms occurring between the crystal and oxide. The near‐surface anisotropy is due to uniaxial strain of a near‐surface region of the crystals. |
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Bibliography: | ArticleID:PSSB200983921 ark:/67375/WNG-1MV97VWK-1 RFBR - No. 08-02-00703 istex:21029385309600864070E267DE0C7235D79585B9 |
ISSN: | 0370-1972 1521-3951 |
DOI: | 10.1002/pssb.200983921 |