Multiport de-embedding technique for balanced varactor high frequency characterization

The present work proposes a simple Pad/Thru de-embedding method for multiport S-parameter measurements of differential varactors. The Pad/Thru method is compared to Open/Short de-embedding and leads to the following strengths: reduction of the wafer area required for dummy structure and reduction of...

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Bibliographic Details
Published in2009 European Microwave Conference (EuMC) pp. 886 - 889
Main Authors Morandini, Y., Debroucke, R., Larchanche, J. F., Jan, S., Boret, S., Gloria, D., Pekarik, J.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.09.2009
Subjects
Atherosclerosis
characterization
CMOS technology
de-embedding
differential
Fingers
high frequency
Impedance
Measurement errors
muliport
Plugs
Probes
Radio frequency
Testing
varactor
Varactors
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Summary:The present work proposes a simple Pad/Thru de-embedding method for multiport S-parameter measurements of differential varactors. The Pad/Thru method is compared to Open/Short de-embedding and leads to the following strengths: reduction of the wafer area required for dummy structure and reduction of the number of measurements required to characterize and de-embed each devices.
ISBN:9781424447480
1424447488
DOI:10.23919/EUMC.2009.5296385