Evaluation of a design methodology dedicated to dose rate hardened linear integrated circuits

A design methodology to harden linear integrated circuits with respect to high dose-rate effects is presented. It takes into account the photocurrents induced within the substrate which are responsible for the major degradation of the electrical response of the circuits. This noninvasive approach ca...

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Bibliographic Details
Published inRADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605) pp. 237 - 242
Main Authors Deval, Y., Lapuyade, H., Fouillat, P., Barnaby, H., Darracq, F., Briand, R., Lewis, D., Schrimpf, R.D.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2001
Subjects
Analog integrated circuits
Application specific integrated circuits
Bipolar transistor circuits
Circuit simulation
Degradation
Design methodology
Nuclear electronics
Nuclear power generation
Photoconductivity
Substrates
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Summary:A design methodology to harden linear integrated circuits with respect to high dose-rate effects is presented. It takes into account the photocurrents induced within the substrate which are responsible for the major degradation of the electrical response of the circuits. This noninvasive approach can be applied to any electronic function. Laser irradiation is used to validate the technique, so that very high level of dose rates can be experimentally simulated.
ISBN:9780780373136
0780373138
DOI:10.1109/RADECS.2001.1159286