Studies of TiO2 Breakdown Under Pulsed Conditions

Model studies of current conduction and breakdown in TiO 2 were carried out. Our simulation results indicate that electrical breakdown of TiO 2 under multiple pulsed conditions can occur at lower voltages as compared to quasi-DC biasing. This is in agreement with experimental data. The results are i...

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Bibliographic Details
Published in2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena pp. 349 - 352
Main Authors Zhao, G., Joshi, R.P., Lakdawala, V.K., Schamiloglu, E., Hjalmarson, H.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.10.2006
Subjects
Breakdown voltage
Ceramics
Dielectric breakdown
Dielectric materials
Dielectrics and electrical insulation
Electric breakdown
Electron traps
Energy storage
Pulse power systems
Testing
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ISBN1424405467
9781424405466
ISSN0084-9162
DOI10.1109/CEIDP.2006.311941

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Summary:Model studies of current conduction and breakdown in TiO 2 were carried out. Our simulation results indicate that electrical breakdown of TiO 2 under multiple pulsed conditions can occur at lower voltages as compared to quasi-DC biasing. This is in agreement with experimental data. The results are indicative of a cumulative effect. We hypothesize that the lower breakdown voltages observed in TiO 2 under pulsed conditions, is a direct rise-time effect, coupled with cummulative detrapping.
ISBN:1424405467
9781424405466
ISSN:0084-9162
DOI:10.1109/CEIDP.2006.311941