Low temperature acoustic microscopy for material characterization

To characterize the mechanical properties of materials at low temperatures, a novel variable low-temperature scanning acoustic microscopy (VLTSAM) has been developed. The temperature of the sample can be continuously varied between 30 degrees C and -94 degrees C in a methanol coupler. As a demonstra...

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Bibliographic Details
Published inIEEE Symposium on Ultrasonics pp. 913 - 920 vol.2
Main Authors Yamanaka, K., Nagata, Y., Koda, T., Karaki, K.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1990
Subjects
Acoustic materials
Acoustic transducers
Frequency
Methanol
Microscopy
Optical materials
Temperature control
Temperature distribution
Temperature sensors
Ultrasonic transducers
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Summary:To characterize the mechanical properties of materials at low temperatures, a novel variable low-temperature scanning acoustic microscopy (VLTSAM) has been developed. The temperature of the sample can be continuously varied between 30 degrees C and -94 degrees C in a methanol coupler. As a demonstration of the VLTSAM, frozen onion cells were imaged at quenched and slowly cooled states. Defects in a 0.6-mm-thick epoxy layer were also observed at -30 degrees C with much more sensitivity than at ambient temperatures. As a tool to analyze subsurface images in VLTSAM, the V(z) curve theory for SAM was extended to describe time-resolved subsurface echoes.< >
DOI:10.1109/ULTSYM.1990.171496