Low temperature acoustic microscopy for material characterization
To characterize the mechanical properties of materials at low temperatures, a novel variable low-temperature scanning acoustic microscopy (VLTSAM) has been developed. The temperature of the sample can be continuously varied between 30 degrees C and -94 degrees C in a methanol coupler. As a demonstra...
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Published in | IEEE Symposium on Ultrasonics pp. 913 - 920 vol.2 |
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Main Authors | , , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
1990
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Subjects | |
Online Access | Get full text |
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Summary: | To characterize the mechanical properties of materials at low temperatures, a novel variable low-temperature scanning acoustic microscopy (VLTSAM) has been developed. The temperature of the sample can be continuously varied between 30 degrees C and -94 degrees C in a methanol coupler. As a demonstration of the VLTSAM, frozen onion cells were imaged at quenched and slowly cooled states. Defects in a 0.6-mm-thick epoxy layer were also observed at -30 degrees C with much more sensitivity than at ambient temperatures. As a tool to analyze subsurface images in VLTSAM, the V(z) curve theory for SAM was extended to describe time-resolved subsurface echoes.< > |
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DOI: | 10.1109/ULTSYM.1990.171496 |