The effect on quality of non-uniform fault coverage and fault probability

This paper addresses problems associated with the production and interpretation of traditional fault coverage numbers. The first part addresses the issue of non-uniform distribution of detected faults. It is shown that there is a large difference in final quality between covering the chip all over a...

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Bibliographic Details
Published inProceedings., International Test Conference pp. 739 - 746
Main Authors Maxwell, P.C., Aitken, R.C., Huisman, L.M.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1994
Subjects
Capacitance
Circuit faults
Companies
Data mining
Electrical fault detection
Fault detection
Information analysis
Probability
Production
Testing
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Summary:This paper addresses problems associated with the production and interpretation of traditional fault coverage numbers. The first part addresses the issue of non-uniform distribution of detected faults. It is shown that there is a large difference in final quality between covering the chip all over and leaving parts relatively untested, even if the coverage is the same in both cases. The second part deals with the use of weighted, rather than unweighted fault coverages and investigates the use of readily-available extracted capacitance information to produce a weighted fault coverage which is more useful for producing quality estimates, without having to perform a full defect analysis. Results show significant differences in weighted versus unweighted coverages, and also that these differences can be in either direction.
ISBN:0780321030
9780780321038
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.1994.528020