Stress and strain in automotive diodes-a RVT, IR and XR study

The methods of achieving the needed reliability for the automotive rectifier CAN diodes are discussed. The RVT tool needed for investigation was found, a new stress relief shape was designed and IR and XR investigations were performed toward the complete elimination of the residual strain left behin...

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Bibliographic Details
Published in1996 International Semiconductor Conference. 19th Edition. CAS'96 Proceedings Vol. 2; pp. 439 - 442 vol.2
Main Authors Galateanu, L., Stoica, M., Bozdog, C., Popa, E., Stoica, A.D.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1996
Subjects
Automotive engineering
Capacitive sensors
Diodes
Performance evaluation
Rough surfaces
Silicon
Soldering
Stress
Surface roughness
System testing
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Summary:The methods of achieving the needed reliability for the automotive rectifier CAN diodes are discussed. The RVT tool needed for investigation was found, a new stress relief shape was designed and IR and XR investigations were performed toward the complete elimination of the residual strain left behind the grinding and diffusion processes. An IR method of the rough surface layer characterization is for the first time employed and the optical configuration for XR experiments was improved in angular resolution.
ISBN:0780332237
9780780332232
DOI:10.1109/SMICND.1996.557414