A systematic approach to statistical simulation of complex analog integrated circuits

• Published in: 1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto pp. 86 - 89
• Main Authors: Swidzinski, J.F., Alexander, D., Qu, M., Styblinski, M.A.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 1997
• Subjects: Analog integrated circuits; Circuit simulation; Fluctuations; Integrated circuit modeling; Integrated circuit noise; Mathematical model; Principal component analysis; Random variables; Semiconductor device modeling; Semiconductor device noise

It is well known that during the manufacturing process integrated circuits are subject to process parameter variations which result in the inherent performance fluctuations. Characterization of these fluctuations in behavioral modeling is extremely important if the high yield of the manufactured cir...