A systematic approach to statistical simulation of complex analog integrated circuits

It is well known that during the manufacturing process integrated circuits are subject to process parameter variations which result in the inherent performance fluctuations. Characterization of these fluctuations in behavioral modeling is extremely important if the high yield of the manufactured cir...

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Bibliographic Details
Published in1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto pp. 86 - 89
Main Authors Swidzinski, J.F., Alexander, D., Qu, M., Styblinski, M.A.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1997
Subjects
Analog integrated circuits
Circuit simulation
Fluctuations
Integrated circuit modeling
Integrated circuit noise
Mathematical model
Principal component analysis
Random variables
Semiconductor device modeling
Semiconductor device noise
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Summary:It is well known that during the manufacturing process integrated circuits are subject to process parameter variations which result in the inherent performance fluctuations. Characterization of these fluctuations in behavioral modeling is extremely important if the high yield of the manufactured circuits is to be achieved. The methodology presented in the paper allows one to build behavioral statistical models which give designers insight into the influence of process and mismatch variations on the operation of the complex IC. Successful statistical simulation of an analog phase-locked loop is presented.
ISBN:0780337379
9780780337374
DOI:10.1109/IWSTM.1997.629420