3-D extraction techniques for signal integrity analysis

In this survey paper we describe recently developed techniques for 3-D extraction of complicated interconnect structures which are both fast and sufficiently accurate to perform signal integrity analysis.

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Bibliographic Details
Published inProceedings of the IEEE 1995 Custom Integrated Circuits Conference pp. 379 - 382
Main Authors Chou, M., Kamon, M., Nabors, K., Phillips, J., White, J.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1995
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Summary:In this survey paper we describe recently developed techniques for 3-D extraction of complicated interconnect structures which are both fast and sufficiently accurate to perform signal integrity analysis.
ISBN:9780780325845
0780325842
DOI:10.1109/CICC.1995.518207