Proposal for combined conducted and radiated emission modelling for Integrated Circuit

This paper describes a methodology to build a combined conducted and radiated emission model for integrated circuits. The development of emission models of a FPGA extracted from two different approaches is presented and discussed. The first approach allows to build a predictable model from FPGA impl...

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Bibliographic Details
Published in2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo) pp. 172 - 177
Main Authors Serpaud, S., Ghfiri, C., Boyer, A., Durier, A.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.07.2017
Subjects
conducted
emission
Field programmable gate arrays
FPGA
ICEM
Integrated circuit
Integrated circuit modeling
Load modeling
Magnetic field measurement
modelling
Near field
radiated
Switches
Wires
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Summary:This paper describes a methodology to build a combined conducted and radiated emission model for integrated circuits. The development of emission models of a FPGA extracted from two different approaches is presented and discussed. The first approach allows to build a predictable model from FPGA implementation and some passive measurement on FPGA device. The second approach allows to build a model from only the near field measurement. In conclusion, the accuracy of both models as well as the advantages and disadvantages are discussed.
DOI:10.1109/EMCCompo.2017.7998105