Semantic modeling for smart manufacturing: towards a data alignment through knowledge formalization for semiconductor wafer fabrication
This paper describes a new approach for the data alignment in the front-end part of semiconductor manufacturing, i.e., wafer fabrication. The approach is based on semantic modeling techniques and focuses on the formalization of engineering knowledge through the creation of a network of ontologies fo...
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Published in | 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) pp. 1 - 6 |
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Main Authors | , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
01.05.2023
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Subjects | |
Online Access | Get full text |
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Summary: | This paper describes a new approach for the data alignment in the front-end part of semiconductor manufacturing, i.e., wafer fabrication. The approach is based on semantic modeling techniques and focuses on the formalization of engineering knowledge through the creation of a network of ontologies for the modelling of wafer fab equipment. A methodology for the creation of such a model is presented as well as an example for the verification of its consistency through a practical use case for STMicroelectronics Crolles 300mm fab |
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ISSN: | 2376-6697 |
DOI: | 10.1109/ASMC57536.2023.10121118 |