Semantic modeling for smart manufacturing: towards a data alignment through knowledge formalization for semiconductor wafer fabrication

This paper describes a new approach for the data alignment in the front-end part of semiconductor manufacturing, i.e., wafer fabrication. The approach is based on semantic modeling techniques and focuses on the formalization of engineering knowledge through the creation of a network of ontologies fo...

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Bibliographic Details
Published in2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) pp. 1 - 6
Main Authors Maslov, Giulia, Yugma, Claude, Vialletelle, Philippe
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.05.2023
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Summary:This paper describes a new approach for the data alignment in the front-end part of semiconductor manufacturing, i.e., wafer fabrication. The approach is based on semantic modeling techniques and focuses on the formalization of engineering knowledge through the creation of a network of ontologies for the modelling of wafer fab equipment. A methodology for the creation of such a model is presented as well as an example for the verification of its consistency through a practical use case for STMicroelectronics Crolles 300mm fab
ISSN:2376-6697
DOI:10.1109/ASMC57536.2023.10121118