Differential P+/Nwell varactor High Frequency Characterization

Here we report, the evaluation of two differential integrated diode varactor layouts. For a first time, differential structures connected to an integrated BalUn are characterized with a two ports vector network analyzer (VNA). Limitations of this method lead us to use four ports measurements. Result...

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Bibliographic Details
Published in2007 IEEE International Conference on Microelectronic Test Structures pp. 187 - 191
Main Authors Morandini, Y., Rapisarda, D., Larchanche, J.-F., Gaquiere, C.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.03.2007
Subjects
differential
Fingers
four ports vector analyzer
high frequency (HF) characterization
Impedance matching
integrated BalUn
Light emitting diodes
Microelectronics
Q factor
Radio frequency
Testing
varactor
Varactors
Voltage-controlled oscillators
Wireless communication
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Summary:Here we report, the evaluation of two differential integrated diode varactor layouts. For a first time, differential structures connected to an integrated BalUn are characterized with a two ports vector network analyzer (VNA). Limitations of this method lead us to use four ports measurements. Results reveal the best layout for differential implementation and the sensitivity to common mode.
ISBN:142440780X
9781424407804
ISSN:1071-9032
2158-1029
DOI:10.1109/ICMTS.2007.374480