A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio ΣΔ ADC

• Published in: IEEE transactions on circuits and systems. I, Regular papers
• Main Authors: Barragan, Manuel J., Alhakim, Rshdee, Stratigopoulos, Haralampos-G., Dubois, Matthieu, Mir, Salvador, Le-Gall, Hervé, Bhargava, Neha, Bal, Ankur
• Format: Journal Article
• Language: English
• Published: IEEE 01.11.2016
• Subjects: Artificial Intelligence; Computer Aided Engineering; Computer Science; Electronics; Embedded Systems; Engineering Sciences; Micro and nanotechnologies; Microelectronics; Modeling and Simulation