A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio ΣΔ ADC

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Bibliographic Details
Published inIEEE transactions on circuits and systems. I, Regular papers
Main Authors Barragan, Manuel J., Alhakim, Rshdee, Stratigopoulos, Haralampos-G., Dubois, Matthieu, Mir, Salvador, Le-Gall, Hervé, Bhargava, Neha, Bal, Ankur
Format Journal Article
LanguageEnglish
Published IEEE 01.11.2016
Subjects
Artificial Intelligence
Computer Aided Engineering
Computer Science
Electronics
Embedded Systems
Engineering Sciences
Micro and nanotechnologies
Microelectronics
Modeling and Simulation
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ISSN:1549-8328
1558-0806
DOI:10.1109/TCSI.2016.2602387