OPTICAL CHARACTERISTICS OF THIN FILMS OF [In.sub.2][O.sub.3] AND ITO
The results of ellipsometric investigations of thin films of [In.sub.2][O.sub.3] and [In.sub.2][O.sub.3]:Sn (90:10%) (ITO) and spectral measurements of the optical transmission are presented. The [In.sub.2][O.sub.3] films were obtained by sputtering on [Al.sub.2][O.sub.3] [012] substrates with the u...
Saved in:
Published in | Journal of applied spectroscopy Vol. 83; no. 3; pp. 478 - 480 |
---|---|
Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Springer
01.07.2016
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | The results of ellipsometric investigations of thin films of [In.sub.2][O.sub.3] and [In.sub.2][O.sub.3]:Sn (90:10%) (ITO) and spectral measurements of the optical transmission are presented. The [In.sub.2][O.sub.3] films were obtained by sputtering on [Al.sub.2][O.sub.3] [012] substrates with the use of improved magnetron equipment VUP-5M. The ITO films on CEC015S glass substrates were manufactured by PG&O. The thicknesses, refractive indices, and forbidden band gaps of the materials were determined. The obtained values agree with previously described results, indicating that the investigated films are of good quality. |
---|---|
ISSN: | 0021-9037 1573-8647 |
DOI: | 10.1007/s10812-016-0314-1 |