Dissimilarity-Based Sequential Backward Feature Selection Algorithm for Fault Diagnosis
The aim of feature selection applied to fault diagnosis is to select an optimal feature subset that is relevant to the faults. The optimal feature subset with fewer features contains more discriminative information which can improve the performance of fault diagnosis models. A novel sequential backw...
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Published in | Neural Information Processing Vol. 10637; pp. 393 - 401 |
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Main Authors | , , |
Format | Book Chapter |
Language | English |
Published |
Switzerland
Springer International Publishing AG
2017
Springer International Publishing |
Series | Lecture Notes in Computer Science |
Subjects | |
Online Access | Get full text |
ISBN | 9783319700922 3319700928 |
ISSN | 0302-9743 1611-3349 |
DOI | 10.1007/978-3-319-70093-9_41 |
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Summary: | The aim of feature selection applied to fault diagnosis is to select an optimal feature subset that is relevant to the faults. The optimal feature subset with fewer features contains more discriminative information which can improve the performance of fault diagnosis models. A novel sequential backward feature selection method based on dissimilarity is proposed to detect the difference of features between normal and fault data. The proposed feature selection method can be used to find relevant features with fault. Furthermore, the fault diagnosis model combines the proposed feature selection method with support vector machine. Experimental results on a chemical process indicate that the proposed feature selection method is useful and superior in fault diagnosis. |
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ISBN: | 9783319700922 3319700928 |
ISSN: | 0302-9743 1611-3349 |
DOI: | 10.1007/978-3-319-70093-9_41 |