Dissimilarity-Based Sequential Backward Feature Selection Algorithm for Fault Diagnosis

The aim of feature selection applied to fault diagnosis is to select an optimal feature subset that is relevant to the faults. The optimal feature subset with fewer features contains more discriminative information which can improve the performance of fault diagnosis models. A novel sequential backw...

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Bibliographic Details
Published inNeural Information Processing Vol. 10637; pp. 393 - 401
Main Authors Xue, Yangtao, Zhang, Li, Wang, Bangjun
Format Book Chapter
LanguageEnglish
Published Switzerland Springer International Publishing AG 2017
Springer International Publishing
SeriesLecture Notes in Computer Science
Subjects
Online AccessGet full text
ISBN9783319700922
3319700928
ISSN0302-9743
1611-3349
DOI10.1007/978-3-319-70093-9_41

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Summary:The aim of feature selection applied to fault diagnosis is to select an optimal feature subset that is relevant to the faults. The optimal feature subset with fewer features contains more discriminative information which can improve the performance of fault diagnosis models. A novel sequential backward feature selection method based on dissimilarity is proposed to detect the difference of features between normal and fault data. The proposed feature selection method can be used to find relevant features with fault. Furthermore, the fault diagnosis model combines the proposed feature selection method with support vector machine. Experimental results on a chemical process indicate that the proposed feature selection method is useful and superior in fault diagnosis.
ISBN:9783319700922
3319700928
ISSN:0302-9743
1611-3349
DOI:10.1007/978-3-319-70093-9_41