Freeze drying technique to prepare cabbage leaves for scanning electron microscopy

Epicuticular waxes of leaves may be important for resistance to insects injuring plants. Freeze-dried leaves of cabbage are suitable for scanning electron microscopy, whereas solvents used in critical-point drying destroy epicuticular waxes

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Bibliographic Details
Published inArchiv für Phytopathologie und Pflanzenschutz Vol. 23; no. 4
Main Authors Eisbein, K, Karl, E. (Institut fuer Phytopathologie, Aschersleben (German D.R.))
Format Journal Article
LanguageGerman
Published 1987
Subjects
CHOU POMME
CONTROL DE INSECTOS
FEUILLE
HOJAS
LIOFILIZACION
LUTTE ANTI-INSECTE
LYOPHILISATION
MICROSCOPIA
MICROSCOPIE
REPOLLO
RESISTANCE AUX RAVAGEURS
RESISTENCIA A LAS PLAGAS
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Summary:Epicuticular waxes of leaves may be important for resistance to insects injuring plants. Freeze-dried leaves of cabbage are suitable for scanning electron microscopy, whereas solvents used in critical-point drying destroy epicuticular waxes
Bibliography:H10
8701115
ISSN:0323-5408
1477-2906
DOI:10.1080/03235408709437723