Microwave permittivity and permeability of MgxMn(0.9−x)Al0.1Zn0.8Fe1.2O4 thick films using superstrate method

• Published in: Microelectronics international Vol. 30; no. 1; pp. 40 - 46
• Main Authors: Kashid, P.B, Kulkarni, D.C, Surve, V.G, Puri, Vijaya
• Format: Journal Article
• Language: English
• Published: Bradford Emerald Group Publishing Limited 01.01.2013; MCB University Press
• Subjects: Antennas; Applied sciences; Circuit properties; Complex permittivity; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Crystal structure; Dielectric properties; Electric, optical and optoelectronic circuits; Electronics; Exact sciences and technology; Grain size; Microwave and radio-frequency interactions (excluding resonances); Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits; Microwaves; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation; Other interactions of matter with particles and radiation; Patch antennas; Permeability; Permittivity; Physics; Power efficiency; Radiocommunications; Screen printing; Silver; Studies; Telecommunications; Telecommunications and information theory; Thick films; Zinc oxides; Screen printing; Films (states of matter); Thick films; EMC patch antenna; Permeability; Microwave permittivity; Spinel ferrite; Microwave antennas; Cubic crystals; Microwave radiation; Superstrate; Electromagnetic compatibility; XRD; Layer thickness; Thick film devices; Ferrite; Spinel; Microstrip antennas; Permittivity
• ISSN: 1356-5362; 1758-812X
• DOI: 10.1108/13565361311298222

Purpose - The purpose of this paper is to study thickness dependent variation in microwave properties of the MgxMn(0.9−x)Al0.1Zn0.8Fe1.2O4 (x=0.8, 0.9) thick films and enhancement of power efficiency of Ag thick film EMC patch antenna.Design methodology approach - X-band microwave properties of the MgxMn(0.9−x)Al0.1Zn0.8Fe1.2O4 (x=0.8, 0.9) thick films were measured by superstrate technique using Ag thick film EMC patch antenna as the resonant element. The complex permittivity and permeability of these thick films were also measured by this technique. The microwave response of the EMC patch, complex permeability and permittivity of Mg0.8Mn0.1Al0.1Zn0.8Fe1.2O4 and Mg0.9Al0.1Zn0.8Fe1.2O4 thick films and their thickness dependency were investigated.Findings - The XRD patterns reveal the cubic spinel crystal system was obtained for both compositions. The crystallite size obtained was 134.68 nm for Mg0.8Mn0.1Al0.1Zn0.8Fe1.2O4 and 155.99 nm for Mg0.9Al0.1Zn0.8Fe1.2O4 The superstrate technique has been used successfully to evaluate the complex permittivity and permeability of the ferrite thick films in the X band. The EMC patch also show thickness and composition dependent frequency agility and enhancement of power efficiency.Originality value - The complex permeability of MgxMn(0.9−x)Al0.1Zn0.8Fe1.2O4 (x=0.8, 0.9) thick films measured by superstrate technique is reported in this paper. The superstrate of MgxMn(0.9−x)Al0.1Zn0.8Fe1.2O4 (x=0.8, 0.9) thick films makes the Ag thick film EMC patch antenna frequency agile and power amplification is obtained.