Surface segregation of aluminum atoms on Cu-9 at.% Al(1 1 1) studied by Auger electron spectroscopy and low energy electron diffraction

• Published in: Surface science Vol. 603; no. 4; pp. 723 - 726
• Main Authors: Yu, Yinghui, Sagisaka, Keisuke, Fujita, Daisuke
• Format: Journal Article
• Language: English
• Published: Kidlington Elsevier B.V 15.02.2009; Elsevier
• Subjects: Annealing temperature; Auger electron spectroscopy; Concentration; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Exact sciences and technology; Low energy electron diffraction; Physics; Annealing temperature; Auger electron spectroscopy; Concentration; Low energy electron diffraction; Annealing; Surface segregation; Aluminium; LEED; AES
• ISSN: 0039-6028; 1879-2758
• DOI: 10.1016/j.susc.2009.01.014

Auger electron spectroscopy (AES) and low energy electron diffraction (LEED) were applied to investigate the segregation of aluminum atoms on a Cu-9 at.% Al(1 1 1) surface. We observed that the Al concentration in the top layer ranged between about 9 and 36 at.% after the sample we used was annealed at different temperatures. The phenomenon of Al atoms segregating on the surfaces was explained well by considering the diffusion length of Al atoms in bulk Cu. LEED measurements showed that ( 3 × 3 ) R30° structures grew as the concentration of Al atoms increased. The segregation phenomena on surfaces resulted in a stable two-dimensional Cu 67Al 33 alloy phase in the top layer.