Composition dependence of structural and optical properties of Cd1−xZnxTe thick films obtained by the close-spaced sublimation

• Published in: Journal of alloys and compounds Vol. 682; pp. 543 - 551
• Main Authors: Kosyak, V., Znamenshchykov, Y., Čerškus, A., Gnatenko, Yu P., Grase, L., Vecstaudza, J., Medvids, A., Opanasyuk, A., Mezinskis, G.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 15.10.2016
• Subjects: Crystal structure; Lattice defects; Photoluminescence; Raman spectroscopy; Semiconducting ternary compounds; X-ray diffraction; X-ray diffraction; Lattice defects; Raman spectroscopy; Photoluminescence; Crystal structure; Semiconducting ternary compounds
• ISSN: 0925-8388; 1873-4669
• DOI: 10.1016/j.jallcom.2016.05.065

This paper reports the results of structural, photoluminescence and Raman characterization of thick Cd1−xZnxTe films with different zinc concentration obtained by the close spaced vacuum sublimation method. The analysis of the X-rays patterns allows us to determine the effect of the zinc concentration on crystal quality of the films. It was found that samples with x ≈ 0.10 and x ≈ 0.32 have high crystal quality. However, with increasing of zinc concentration the crystal quality decreases. This result was confirmed by the photoluminescence study. Namely, the significant degradation of optical properties for the samples with high zinc concentration (x > 0.32) was observed. Raman spectroscopy reveals the relation between zinc concentration and vibrational properties of the films. Also, the micro-Raman method shows that obtained films are uniform and free of tellurium inclusions. •New approach for deposition of Cd1−xZnxTe thick films has been developed.•Effect of chemical composition on Cd1−xZnxTe thick films properties was studied.•The proposed approach allows obtaining of high-quality Cd1−xZnxTe thick films.•Compositional dependence of Raman modes frequencies was established.