Raman validity for crystallite size L a determination on reticulated vitreous carbon with different graphitization index

• Published in: Applied surface science Vol. 254; no. 2; pp. 600 - 603
• Main Authors: Baldan, M.R., Almeida, E.C., Azevedo, A.F., Gonçalves, E.S., Rezende, M.C., Ferreira, N.G.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 15.11.2007
• Subjects: Carbon; Raman spectroscopy; X-ray diffraction; X-ray diffraction; Raman spectroscopy; Carbon
• ISSN: 0169-4332; 1873-5584
• DOI: 10.1016/j.apsusc.2007.06.038

The graphitization index provided by X-ray diffraction (XRD) and Raman spectrometry for reticulated vitreous carbon (RVC) substrates, carbonized at different heat treatment temperatures (HTT), is investigated. A systematic study of the dependence between the disorder-induced D and G Raman bands is presented. The crystallite size L a was obtained for both X-ray diffraction and Raman spectrometry techniques. Particularly, the validity for L a determination, from Raman spectra, is pointed out comparing the commonly used formula based on peaks amplitude ratio ( I D/ I G) and the recent proposed equation that uses the integrated intensities of D and G bands. The results discrepancy is discussed taken into account the strong contribution of the line broadening presented in carbon materials heat treated below 2000 °C.