High-frequency dielectric anomalies in a highly frustrated square kagomé lattice nabokoite family compounds ACu7(TeO4)(SO4)5Cl (A = Na, K, Rb, Cs)
Nabokoite family compounds ACu7(TeO4)(SO4)5Cl (A = Na, K, Cs, Rb) are candidates for the experimental realization of highly-frustrated 2D square kagomé lattice (SKL). Their magnetic subsystem includes SKL layers decorated by additional copper ions. All members of this family are characterized by qui...
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Published in | Journal of magnetism and magnetic materials Vol. 592 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
Elsevier B.V
15.02.2024
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Subjects | |
Online Access | Get full text |
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Summary: | Nabokoite family compounds ACu7(TeO4)(SO4)5Cl (A = Na, K, Cs, Rb) are candidates for the experimental realization of highly-frustrated 2D square kagomé lattice (SKL). Their magnetic subsystem includes SKL layers decorated by additional copper ions. All members of this family are characterized by quite high Curie–Weiss temperatures (∼ 80–200 K), but magnetic ordering was reported only for Na and K compounds at a much lower temperatures below 4 K. We report here results of the study of high-frequency (∼10 GHz) dielectric properties of this family of compounds. Our study revealed presence of the strong dielectric anomaly both in the real and imaginary parts of high-frequency dielectric permittivity for Na and K compounds approx. 100 and 26 K, correspondingly, presumably related to antiferroelectric ordering. Additionally, much weaker anomalies were observed at approx. 5 K indicating possible interplay of magnetic and lattice degrees of freedom. We discuss possible relation between the structure rearrangements accompanying dielectric anomalies and a delayed magnetic ordering in the nabokoite family compounds.
•Nabokoite family compounds – spin liquid candidates on a square kagome lattice.•High-frequency (10 GHz range) dielectric anomalies are found.•High-frequency dielectric anomalies are probably a key to spin liquid freezing. |
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ISSN: | 0304-8853 |
DOI: | 10.1016/j.jmmm.2024.171786 |