Defect annihilation-mediated enhanced activation energy of GaAs0.979N0.021-capped InAs/GaAs quantum dots by H− ion implantation
Self-assembled InAs/GaAs quantum dots capped with GaAs0.979N0.021 quantum well grown on GaAs (001) substrates exhibited emission even beyond 1.5μm at room temperature. A low activation energy of 51meV was found, attributed to the incorporation of N into the capping layer. Rapid thermal annealing suf...
Saved in:
Published in | Thin solid films Vol. 639; pp. 73 - 77 |
---|---|
Main Authors | , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
Elsevier B.V
01.10.2017
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | Self-assembled InAs/GaAs quantum dots capped with GaAs0.979N0.021 quantum well grown on GaAs (001) substrates exhibited emission even beyond 1.5μm at room temperature. A low activation energy of 51meV was found, attributed to the incorporation of N into the capping layer. Rapid thermal annealing sufficiently improved photoluminescence (PL) intensity, but it causes strong blue-shift in the PL spectra due to In/Ga intermixing and N out-diffusion and slightly enhanced activation energy of 58.5meV. Because of the blue-shift and low activation energy, optoelectronic devices, where the design is based on a specific wavelength from the active layer, will automatically result in wavelength-sensitive failure. Implanting H– ions resulted in a two-fold improvement in the PL intensity without the blue-shift and also exhibited an activation energy of 71meV, attributed to the annihilation of defects via formation of N2H complexes. Thus, implanted samples are recommended for wavelength-sensitive optoelectronic device applications.
•GaAs0.979N0.021 capped InAs/GaAs QDs exhibited emission beyond 1.5μm at 300K.•60-fold improvement in intensity after annealing, but blue-shift in emission spectra•H-ion implantation resolved the unwanted blue-shift caused by annealing.•A high activation energy achieved after implantation; defect annihilation.•Constancy in peak emission; application in lasers |
---|---|
ISSN: | 0040-6090 1879-2731 |
DOI: | 10.1016/j.tsf.2017.08.026 |