C 60 adsorption on the Si(110)-(16 × 2) surface

The interaction of C 60 with the Si(110)-(16 × 2) surface has been studied using a scanning tunnelling microscope (STM). For a submonolayer coverage isolated C 60 molecules are observed with no evidence for a preferential adsorption site. As the coverage is increased, a disordered monolayer is obser...

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Bibliographic Details
Published inSurface science Vol. 397; no. 1; pp. 421 - 425
Main Authors Ma, Y.-R., Moriarty, P., Upward, M.D., Beton, P.H.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.02.1998
Subjects
Adsorption kinetics
Coatings
Fullerenes
Scanning tunneling microscopy
Silicon
Fullerenes
Scanning tunneling microscopy
Adsorption kinetics
Silicon
Coatings
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Summary:The interaction of C 60 with the Si(110)-(16 × 2) surface has been studied using a scanning tunnelling microscope (STM). For a submonolayer coverage isolated C 60 molecules are observed with no evidence for a preferential adsorption site. As the coverage is increased, a disordered monolayer is observed and at still higher coverage disordered aggregates are observed which ripen into hexagonally ordered islands. These islands could be disrupted by the STM tip and were desorbed by annealing. Our results show that the interaction between the disordered layer and C 60 islands is weak. However, the first monolayer is strongly bonded to the Si surface and forms a passivating layer which is stable to exposure to atmosphere.
ISSN:0039-6028
1879-2758
DOI:10.1016/S0039-6028(97)00716-4