Strong charge state dependence of H + and H 2+ sputtering induced by slow highly charged ions
Secondary ion emission has been studied for very slow (∼ 0.01 ν B) highly charged Ar and N ions bombarding C 60 containing hydrogen as an impurity. It is found that the fragmentations of C 60 are very rare even for Ar 16+ bombardments. On the other hand, the sputtering of H + and H 2 + has been obse...
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Published in | Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Vol. 96; no. 3; pp. 541 - 544 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
Elsevier B.V
01.05.1995
|
Online Access | Get full text |
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Abstract | Secondary ion emission has been studied for very slow (∼ 0.01
ν
B) highly charged Ar and N ions bombarding C
60 containing hydrogen as an impurity. It is found that the fragmentations of C
60 are very rare even for Ar
16+ bombardments. On the other hand, the sputtering of H
+ and H
2
+ has been observed to increase drastically as a function of incident charge
q like
q
γ
(e.g.,
γ ∼ 4.6 for H
+ sputtering by 500 eV Ar
q+
). |
---|---|
AbstractList | Secondary ion emission has been studied for very slow (∼ 0.01
ν
B) highly charged Ar and N ions bombarding C
60 containing hydrogen as an impurity. It is found that the fragmentations of C
60 are very rare even for Ar
16+ bombardments. On the other hand, the sputtering of H
+ and H
2
+ has been observed to increase drastically as a function of incident charge
q like
q
γ
(e.g.,
γ ∼ 4.6 for H
+ sputtering by 500 eV Ar
q+
). |
Author | Yamazaki, Y. Komaki, K. Azuma, T. Kuroki, K. Kakutani, N. |
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ContentType | Journal Article |
Copyright | 1995 |
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DOI | 10.1016/0168-583X(95)00240-5 |
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References | Della-Negra, Depauw, Joret, Le Beyec, Schweikert, Bitensky, Parilis, Della-Negra, Le Beyec (BIB3) 1988; 60 E.S. Parilis et al. (eds.) Atomic Collisions on Solid Surface, p. 539 Sueoka (BIB6) 1982; 21 Kurz (BIB5) 1993; 48 Walch (BIB7) 1994; 72 Sigmund, Parilis, Parilis (BIB1) 1987; 27 Ding, Baragiola, Madey (BIB8) 1984; 140 Okuno (BIB4) 1989; 28 |
References_xml | – volume: 72 start-page: 1439 year: 1994 ident: BIB7 publication-title: Phys. Rev. Lett. contributor: fullname: Walch – volume: 48 start-page: 2182 year: 1993 ident: BIB5 publication-title: Phys. Rev. A contributor: fullname: Kurz – volume: 21 start-page: 702 year: 1982 ident: BIB6 publication-title: Jpn. J. Appl. Phys. contributor: fullname: Sueoka – volume: 140 start-page: L264 year: 1984 ident: BIB8 publication-title: Surf. Sci. contributor: fullname: Madey – volume: 28 start-page: 1124 year: 1989 ident: BIB4 publication-title: Jpn. J. Appl. Phys. contributor: fullname: Okuno – volume: 27 start-page: 1 year: 1987 ident: BIB1 publication-title: Nucl. Instr. and Meth. B contributor: fullname: Parilis – volume: 60 start-page: 948 year: 1988 ident: BIB3 publication-title: Phys. Rev. Lett. contributor: fullname: Le Beyec |
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Snippet | Secondary ion emission has been studied for very slow (∼ 0.01
ν
B) highly charged Ar and N ions bombarding C
60 containing hydrogen as an impurity. It is found... |
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Title | Strong charge state dependence of H + and H 2+ sputtering induced by slow highly charged ions |
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