Strong charge state dependence of H + and H 2+ sputtering induced by slow highly charged ions

Secondary ion emission has been studied for very slow (∼ 0.01 ν B) highly charged Ar and N ions bombarding C 60 containing hydrogen as an impurity. It is found that the fragmentations of C 60 are very rare even for Ar 16+ bombardments. On the other hand, the sputtering of H + and H 2 + has been obse...

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Published inNuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Vol. 96; no. 3; pp. 541 - 544
Main Authors Kakutani, N., Azuma, T., Yamazaki, Y., Komaki, K., Kuroki, K.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.05.1995
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Summary:Secondary ion emission has been studied for very slow (∼ 0.01 ν B) highly charged Ar and N ions bombarding C 60 containing hydrogen as an impurity. It is found that the fragmentations of C 60 are very rare even for Ar 16+ bombardments. On the other hand, the sputtering of H + and H 2 + has been observed to increase drastically as a function of incident charge q like q γ (e.g., γ ∼ 4.6 for H + sputtering by 500 eV Ar q+ ).
ISSN:0168-583X
1872-9584
DOI:10.1016/0168-583X(95)00240-5