Anomalous Nernst effect in epitaxially grown Fe4−xNixN films

Anomalous Nernst effect of epitaxial Fe4−xNixN films on MgAl2O4(001) substrates was characterized. The Ni/Fe ratio (x) in Fe4−xNixN films was changed in the range of 0 ≤ x ≤ 2.8, and the Fe4−xNixN phase started to decompose into FeNi at about x = 2.2. The anomalous Nernst coefficient (SANE) decrease...

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Bibliographic Details
Published inAIP advances Vol. 13; no. 2; pp. 025243 - 025243-6
Main Authors Yin, Weida, Ito, Keita, Tsubowa, Yusuke, Tsujikawa, Masahito, Shirai, Masafumi, Takanashi, Koki
Format Journal Article
LanguageEnglish
Published Melville American Institute of Physics 01.02.2023
AIP Publishing LLC
Subjects
Epitaxial growth
First principles
Iron nitride
Nernst-Ettingshausen effect
Seebeck effect
Substrates
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Summary:Anomalous Nernst effect of epitaxial Fe4−xNixN films on MgAl2O4(001) substrates was characterized. The Ni/Fe ratio (x) in Fe4−xNixN films was changed in the range of 0 ≤ x ≤ 2.8, and the Fe4−xNixN phase started to decompose into FeNi at about x = 2.2. The anomalous Nernst coefficient (SANE) decreased with x from 1.7 to 0.6 μV/K and the Seebeck coefficient increased with x from −2.3 to 1.2 μV/K. The transverse thermoelectric conductivity (αxy) evaluated from the experimental data showed a decrease with x and the change of αxy dominated the change of SANE. The anomalous Hall conductivity and αxy of Fe4N and Fe2.8Ni1.2N were obtained by first-principles calculations, showing a significant difference from the experimental results, which might be caused by the contribution from the extrinsic mechanisms.
ISSN:2158-3226
2158-3226
DOI:10.1063/9.0000564