Guimaraes Leal, M. V., Azizimanesh, A., Hasan, N., & Wu, S. M. (2025). Performance and Scalability of Strain Engineered 2D MoTe2 Phase-Change Memristors. IEEE journal of the Electron Devices Society, 13, 343-349. https://doi.org/10.1109/JEDS.2025.3556316
Chicago Style (17th ed.) CitationGuimaraes Leal, Maria Vitoria, Ahmad Azizimanesh, Nazmul Hasan, and Stephen M. Wu. "Performance and Scalability of Strain Engineered 2D MoTe2 Phase-Change Memristors." IEEE Journal of the Electron Devices Society 13 (2025): 343-349. https://doi.org/10.1109/JEDS.2025.3556316.
MLA (9th ed.) CitationGuimaraes Leal, Maria Vitoria, et al. "Performance and Scalability of Strain Engineered 2D MoTe2 Phase-Change Memristors." IEEE Journal of the Electron Devices Society, vol. 13, 2025, pp. 343-349, https://doi.org/10.1109/JEDS.2025.3556316.