iGSE-CD-An Electric-/Displacement-Field Related Steinmetz Model for Class II Multilayer Ceramic Capacitors under Low-Frequency Large-Signal Excitation

• Published in: IEEE open journal of power electronics Vol. 4; pp. 1 - 9
• Main Authors: Menzi, David, Heller, Morris, Kerridge, George, Marley, Peter, Ellmore, Angela, Ben-Yaakov, Shmuel, Kolar, Johann W.
• Format: Journal Article
• Language: English
• Published: IEEE 2023
• Subjects: AC-DC power converters; Capacitance; DC-AC power converters; Dielectric losses; Dielectric materials; Dielectrics; iGSE; iGSE-C; inverters; loss modeling; Mathematical models; Microscopy; MLCC; Multilayer ceramic capacitor; power capacitors; rectifiers; Steinmetz Equation; Voltage
• ISSN: 2644-1314
• DOI: 10.1109/OJPEL.2023.3240838

Multilayer Ceramic Capacitors (MLCCs) are of paramount importance in electronics and ferroelectric Class II dielectrics enable outstanding energy-density values. However, the non-linear dielectric constant and associated low-frequency large-signal excitation losses of Class II MLCCs may cause critical overheating. A peak-charge based Steinmetz loss model entitled iGSE-C Q is known in literature and allows to accurately calculate MLCC low-frequency large-signal excitation losses under various operating conditions including biased and non-sinusoidal excitation voltage waveforms. Such a macroscopic iGSE-C Q model, however, is inherently limited to a specific MLCC, and in contrast to Steinmetz loss modeling for ferromagnetic inductor cores, the losses of other devices employing the same dielectric material cannot be predicted. Recent literature therefore proposed a microscopic and/or material specific MLCC Steinmetz Model entitled iGSE-C D which allows to calculate the losses of any MLCC of the same dielectric material based upon just a single set of Steinmetz parameters. However, due to the lack of information on the internal device geometry, the iGSE-C D could be verified only indirectly so far by means of a loss normalization based on the device capacitance and rated voltage. In this paper, we demonstrate the feasibility of a microscopic iGSE-C D MLCC loss model enabled by manufacturer data on the internal capacitor structure. The iGSE-C D is verified for two different MLCC series employing a conventional X7R dielectric and a novel Hiteca (with reduced non-linearity) Class II dielectric material with loss estimation error below 22%. This error results due to component tolerances and is acceptable, especially when compared to the loss calculation based on the datasheet information which can be off by up to a factor of ten. The analysis of the Hiteca dielectric reveals a frequency behavior different to the X7R material, and is discussed in the Appendix of this paper.