Constant voltage stress induced current in Ta 2 O 5 stacks and its dependence on a gate electrode

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Bibliographic Details
Published in	Semiconductor science and technology Vol. 23; no. 7; p. 75017
Main Authors	Atanassova, E, Stojadinovic, N, Paskaleva, A, Spassov, D, Vracar, L, Georgieva, M
Format	Journal Article
Language	English
Published	01.07.2008
Online Access	Get full text

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ISSN:	0268-1242 1361-6641
DOI:	10.1088/0268-1242/23/7/075017