Electronic properties of Co 2 MnSi thin films studied by hard x-ray photoelectron spectroscopy

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Bibliographic Details
Published inJournal of physics. D, Applied physics Vol. 42; no. 8; p. 84011
Main Authors Ouardi, Siham, Gloskovskii, Andrei, Balke, Benjamin, Jenkins, Catherine A, Barth, Joachim, Fecher, Gerhard H, Felser, Claudia, Gorgoi, Mihaela, Mertin, Marcel, Schäfers, Franz, Ikenaga, Eiji, Yang, Ke, Kobayashi, Keisuke, Kubota, Takahide, Oogane, Mikihiko, Ando, Yasuo
Format Journal Article
LanguageEnglish
Published 21.04.2009
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ISSN:0022-3727
1361-6463
DOI:10.1088/0022-3727/42/8/084011